Siltanen, Mikael; Cattaneo, Stefano; Vuorimaa, Elina; Lemmetyinen, Helge; Katz, Thomas J.; Phillips, Karen E. S.; Kauranen, Martti (2004)
We present a new technique, based on regression analysis, to determine the second-order nonlinear optical susceptibility tensor of thin films. The technique does not require the absolute levels or phases of measured signals ...