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A walk from 2-norm SVM to 1-norm SVM

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Title: A walk from 2-norm SVM to 1-norm SVM
Author: Kujala, Jussi; Aho, Timo; Elomaa, Tapio
Abstract: This paper studies how useful the standard 2-norm regularized SVM is in approximating the 1-norm SVM problem. To this end, we examine a general method that is based on iteratively re-weighting the features and solving a 2-norm optimization problem. The convergence rate of this method is unknown. Previous work indicates that it might require an excessive number of iterations. We study how well we can do with just a small number of iterations. In theory the convergence rate is fast, except for coordinates of the current solution that are close to zero. Our empirical experiments confirm this. In many problems with irrelevant features, already one iteration is often enough to produce accuracy as good as or better than that of the 1-norm SVM. Hence, it seems that in these problems we do not need to converge to the 1-norm SVM solution near zero values. The benefit of this approach is that we can build something similar to the 1-norm regularized solver based on any 2-norm regularized solver. This is quick to implement and the solution inherits the good qualities of the solver such as scalability and stability.
Issue date: 2009
Citation: Kujala, Jussi, Aho, Timo & Elomaa, Tapio 2009. A walk from 2-norm SVM to 1-norm SVM . In: Wang, W. et al. (eds.). Proceedings of the 9th IEEE International Conference on Data Mining, ICDM 2009, Miami, Florida, USA, 6-9 December 2009 pp. 836-841.
DOI: http://dx.doi.org/10.1109/ICDM.2009.100
Peer review status: Peer-reviewed
Description: © 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Belongs to: In: Wang, W. et al. (eds.). Proceedings of the 9th IEEE International Conference on Data Mining, ICDM 2009, Miami, Florida, USA, 6-9 December 2009
URN: http://URN.fi/URN:NBN:fi:tty-201104152143
Publication type: Konferenssijulkaisu - Conference paper
Pages: pp. 836-841
University: Tampereen teknillinen yliopisto - Tampere University of Technology
Faculty: Tieto- ja sähkötekniikan tiedekunta – Faculty of Computing and Electrical Engineering
Department: Ohjelmistotekniikan laitos – Department of Software Systems
Copyright: This publication is copyrighted. You may download, display and print it for Your own personal use. Commercial use is prohibited.

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